Abstract: In order to resolve the lower precision of optoelectronic theodolite dynamic measure precision, a method which is based on the correction of different delay time between the clock base and other sub - systems was proposed. The measurement theory and shipment of optoelectronic theodolite were introduced, the relationship between the object and the image was analysis. The reason which infects the precision were accuracy of camera inside azimuth element and the adjustment of optical distortion was pointed. And the reasons which effect the optoelectronic theodolite dynamic measurement were analysis, and the different delay time between different sub -system parameter were pointed. The correction and accuracy of the method were verified by test data, the average variance of optoelectronic theodolite dynamic error in horizontal and vertical were improved from 27.89 and 17.67 to 10.07 and 8.56. This method improves the dynamic measure precision of optoelectronic theodolite and is suitable for other optical electronic measurement system.