[1] |
冯博, 刘炳国, 陈凤东, 等. 光学元件损伤在线检测图像处理技术 [J]. 强激光与粒子束, 2013, 25(7): 1697. doi: 10.3788/HPLPB20132507.1697
Feng B, Liu B G, Cheng F D, et al. Image processing technology for online detection of optical element damage [J]. High Power Laser and Particle Beams, 2013, 25(7): 1697. (in Chinese) doi: 10.3788/HPLPB20132507.1697 |
[2] |
邱荣. 强激光诱导光学元件损伤的研究[D]. 绵阳: 中国工程物理研究院, 2013.
Qiu R. Study on optical element damage induced by high intensity laser[D]. Mianyang: China Academy of Engineering Physics, 2013. (in Chinese) |
[3] |
杨亮. 光学元件表面污染对负载能力影响的研究[D]. 成都: 电子科技大学, 2016.
Yang L. Study on the effect of optical component surface contamination on load capacity[D]. Chengdu: University of Electronic Science and Technology of China, 2016. (in Chinese) |
[4] |
Fournier J, Grua P, Néauport J, et al. Temperature dependence of luminescence for different surface flaws in high purity silica glass [J]. Optical Materials Express, 2013, 3(1): 1-10. doi: 10.1364/OME.3.000001 |
[5] |
Demos S, Staggs M, Minoshima K, et al. Characterization of laser induced damage sites in optical components [J]. Optics Express, 2003, 10(25): 1444-1450. |
[6] |
Liao Z M, Raymond B, Gaylord J, et al. Damage modeling and statistical analysis of optics damage performance in MJ-class laser systems [J]. Optics Express, 2014, 22(23): 28845-28856. doi: 10.1364/OE.22.028845 |
[7] |
周丽丹, 粟敬钦, 张小民, 等. 光学元件"缺陷"对助推放大级光束质量的影响 [J]. 强激光与粒子束, 2009, 21(3): 326.
Zhou L D, Su J Q, Zhang X M, et al. Effect of optical element "defects" on beam quality of boost amplifier stage [J]. High Power Laser and Particle Beams, 2009, 21(3): 326. (in Chinese) |
[8] |
Zhu Y N. Discussion of the measurement methods for laser induced damage threshold of optical coating [J]. Laser Technology, 2006, 30(5): 0532. |
[9] |
Mann G, Pentzien S, Krüger J. Beam diameter dependence of surface damage threshold of fused silica fibers and preforms for nanosecond laser treatment at 1064 nm wavelength [J]. Applied Surface Science, 2013, 276: 312-316. doi: 10.1016/j.apsusc.2013.03.088 |
[10] |
International Organization for Standardization. ISO 11254-2:2001 SNV[S].The Swiss Association for Standardization, 2001.ical surfaces - Part2: S-on-1 test [S]. Swiss: The Swiss Association for Standardization, 2001. https://www.intertekinform.com/en-AU/standards/iso-11254-2-2001-596043_saig_iso_iso_1365380/. |
[11] |
Rudolph W, Emmert L A, Rodriguez C, et al. Femtosecond to nanosecond laser damage in dielectric materials[C]//Pacific Rim Laser Damage 2013, Optical Materials for High Power Lasers, SPIE, 2013, 8786: 878602. |
[12] |
Sozet M, Néauport J, Lavastre E, et al. Laser damage density measurement of optical components in the sub-picosecond regime [J]. Optics Letters, 2015, 40(9): 2091-2094. doi: 10.1364/OL.40.002091 |
[13] |
Martin S, Stéphane B, Johann B, et al. Sub-picosecond laser damage growth on high reflective coatings for high power applications [J]. Optics Express, 2017, 25(21): 25767. doi: 10.1364/OE.25.025767 |
[14] |
Riede W, Willamowski U, Dieckmann M, et al. Laser-induced damage measurements according to ISO/DIS 11254-1: Results of a national round robin experiment on Nd:YAG laser optics[C]//Proc SPIE, 1998, 3244: 1997. |
[15] |
Bingelyte V, Sirutkaitis V, Eckardt R C. S-on-1-induced damage thresholds of high-reflection metallic coatings at 1064 nm[C]//Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, SPIE, 2003, 4932: 513-519. |
[16] |
Wu S, Shi W, Su J. Using an external electric field to reduce laser damage of DLC films [J]. International Journal of Materials and Product Technology, 2012, 45(1-4): 74-82. |
[17] |
Luo S, Sasaki O, Chen Z, et al. Exact surface profile measurement without subtracting dispersion phase through Fourier transform in a white-light scanning interferometer [J]. Applied Optics, 2018, 57(4): 894-899. doi: 10.1364/AO.57.000894 |
[18] |
Zhang Y M, Jing W C, Zhang H X, et al. Computerized white light scanning interferometer and the application [J]. Optics and Precision Engineering, 2004, 12(6): 560-565. |
[19] |
Luu L, Wang Z, Vo M, et al. Accuracy enhancement of digital image correlation with B-spline interpolation [J]. Optics Letters, 2011, 36(16): 3070-3072. doi: 10.1364/OL.36.003070 |
[20] |
Gao S, Gruev V. Bilinear and bicubic interpolation methods for division of focal plane polarimeters [J]. Optics Express, 2011, 19(27): 26161-26173. doi: 10.1364/OE.19.026161 |