[1]
[2] Li Jingzhen. Optical Handbook[M]. Xi'an: Shaanxi Science and Technology Press, 2010. (in Chinese)
[3] Daimon Masahiko, Masumura Akira. High-accuracy measurements of the refractive index and its temperature coefficient of calcium fluoride in a wide wavelength range from 138 to 2326 nm [J]. Appl Opt, 2002, 41(25): 5275-5281. doi:  10.1364/AO.41.005275
[4] Talim S P. Measurement of the refractive index of a prism by a critical angle method [J]. J Opt A: Pure Appl Opt, 2010, 25(2): 157-165.
[5] Plotnichenko Victor G, Sokolov Vyacheslav O. Influence of absorption on the refractive index determination accuracy by the minimum deviation method [J]. Appl Opt, 2018, 57(4): 639-647. doi:  10.1364/AO.57.000639
[6] Monneret S, Huguet-Chantme P, Flory F. M-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides [J]. J of Opt A: Pure Appl Opt, 2000, 2(3): 188-195. doi:  10.1088/1464-4258/2/3/304
[7] Gillen G D, Guha S. Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafers [J]. Appl Opt, 2005, 44(3): 344-347. doi:  10.1364/AO.44.000344
[8] Ince R, Hueseyinoglu E. Decoupling refractive index and geometric thickness from interferometric measurements of a quartz sample using a fourth-order polynomial [J]. Appl Opt, 2007, 46(17): 3498-503. doi:  10.1364/AO.46.003498
[9] Giuseppe C, Pietro F, Mario I, et al. Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interfero -meter [J]. Appl Opt, 2003, 42(19): 3882. doi:  10.1364/AO.42.003882
[10] Joo C H, Hong L H, Seb M H, et al. Measurement of refractive index and thickness of transparent plate by dual-wavelength interference [J]. Opt Express, 2010, 18(9): 9429-34. doi:  10.1364/OE.18.009429
[11] Hwan K S, Hun L S, In L J, et al. Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry [J]. Appl Opt, 2010, 49(5): 910-4. doi:  10.1364/AO.49.000910
[12] Andrushchak N A, Syrotynsky O I, Karbovnyk I D, et al. Interferometry technique for refractive index measurements at subcentimeter wavelengths [J]. Microw Opt Technol Let., 2011, 53(5): 1193-1196. doi:  10.1002/mop.25944
[13] Li J, Wang Y R, Meng X F, et al. Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry [J]. Opt Laser Technol, 2014, 56: 241-246. doi:  10.1016/j.optlastec.2013.08.019
[14] Lacot E, Day R, Stoeckel F. Laser optical feedback tomography [J]. Opt Lett, 1999, 24(11): 744-746. doi:  10.1364/OL.24.000744
[15] Yu Daoyin, Tan Hengying. Engineering Optics[M]. Beijing: Machinery Industry Press, 2011. (in Chinese)
[16] Ni Yucai. Modification of Edlén equation for air refractive index [J]. Metrological Technique, 1998(3): 22-27. (in Chinese)
[17] Shi Changyan. Guide for evaluation and presentation of measurement uncertainty[M]. Beijing: Chinese Metrology Press, 2000. (in Chinese)
[18] Zhuang Zhenghui, Wu Xianqiu, Chen Hao. The derivation of Bessel's formula and its physical meaning [J]. College Physics Experiment, 2010, 23(4): 80-82. (in Chinese)
[19] Skauli T, Kuo P S, Vodopyanov K L, et al. Improved dispersion relations for GaAs and applications to nonlinear optics [J]. Journal of Applied Physics, 2003, 94(10): 6447-6455. doi:  10.1063/1.1621740