[1] Markovitz T, Shtrichman I. Megapixel digital InSb detector for mid-wave infrared imaging [J]. Optical Engineering, 2011, 50(6): 409−421.
[2] Michel V. Latest developments of cooled infrared detectors at Sofradir, France [J]. Defence Science Journal, 2013, 63(6): 550−554. doi:  10.14429/dsj.63.5754
[3] Kenneth I, Michael W, Justin J, et al. Digital-pixel focal plane array technology [J]. Lincoln Laboratory Journal, 2014, 20(2): 36−51.
[4] 尹士畅, 喻松林, 于艳. 一种应用于线列TDI型红外焦平面的数字化读出电路[J]. 激光与红外, 2013, 43(5): 540−543. doi:  10.3969/j.issn.1001-5078.2013.05.015

Yin Shichang, Yu Songlin, Yu Yan. New digitalized ROIC for linear TDI IRFPA [J]. Laser & Infrared, 2013, 43(5): 540−543. (in Chinese) doi:  10.3969/j.issn.1001-5078.2013.05.015
[5] 高磊, 翟永成, 梁清华, 等. 红外焦平面读出电路集成数字输出[J]. 红外激光与工程, 2015, 44(6): 1686−1691.

Gao Lei, Zhai Yongcheng, Liang Qinghua, et al. IRFPA ROIC integrated digital output [J]. Infrared and Laser Engineering, 2015, 44(6): 1686−1691. (in Chinese)
[6] 白丕绩, 赵俊, 韩福忠, 等. 数字化中波红外焦平面探测器组件研究进展[J]. 红外与激光工程, 2017, 46(1): 0102003.

Bai Piji, Zhao Jun, Han Fuzhong, et al. Review of digital mid-wave infrared focal plane array detector assembly [J]. Infrared and Laser Engineering, 2017, 46(1): 0102003. (in Chinese)
[7] Yang S, Luo L, Lu W, et al. A 16-bit two-step pixel-level ADC for 384*288 infrared focal plane array [C]//2017 IEEE 12th International Conference on ASIC (ASICON). IEEE, 2017.
[8] 何力, 杨定江, 倪国强, 等. 先进焦平面技术导论 [M]. 北京: 国防工业出版社, 2011.

He Li, Yang Dingjiang, Ni Guoqiang, et al. Introduction to Advanced Focal Plane Arrays [M]. Beijing: National Defense Industry Press, 2011. (in Chinese)
[9] Reibel Y, Rubaldo L, Bonnouvrier G, et al. Latest developments in advanced MCT infrared cooled detectors [C]//Proceedings of SPIE, 2011, 8185(4): 818503.
[10] Duan J, Jin L, Chen D. Testing ADC spectral performance without dedicated data acquisition [J]. IEEE Transactions on Instrumentation and Measurement, 2012, 61(11): 2941−2952. doi:  10.1109/TIM.2012.2202949
[11] Agrez, D. Analysis of the residual spectrum in ADC dynamic testing [J]. IEEE Transactions on Instrumentation and Measurement, 2009, 58(3): 506−511. doi:  10.1109/TIM.2009.2005558
[12] 中国航天工业总公司七七一所. 半导体集成电路数/模转换器和模/数转换器测试方法. QJ 3044-1998[S].北京: 行业标准-航天（CN-QJ）,1998.
[13] Maxim Integrated, Histogram Testing Determines DNL and INL Errors[EB/OL].[2003-06-18].https://www.maximintegrated.com/en/app-notes/index.mvp/id/2085
[14] Xu L, Sudani S K, Chen D. Efficient spectral testing with clipped and noncoherently sampled data [J]. IEEE Transactions on Instrumentation and Measurement, 2014, 63(6): 1451−1460. doi:  10.1109/TIM.2013.2292273
[15] Rebai C, Dallet D, Marchegay P. Non coherent spectral analysis of ADC using filter bank[C]//Instrumentation and Measurement Technology Conference, 2002.
[16] Engineer A D I. Data Conversion Handbook - Analog Devices Inc[Z]. Data Conversion Handbook. 2013.
[17] 戴澜, 姜岩峰, 刘文楷. 基于Matlab的高速高精度ADC测试研究[J]. 计算机测量与控制, 2010, 18(9): 2044−2045,2049.

Dan Lan, Jiang Yanfeng, Liu Wenkai. Testing research based on Matlab for high-speed and high-resolution ADC [J]. Computer Measurement & Control, 2010, 18(9): 2044−2045,2049. (in Chinese)
[18] Fexa P, Vedral J. Developing automated data acquisition system for ADC and DAC testing[C]//Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on, 2011.