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条纹投影与相位偏折测量技术研究进展

刘东,  严天亮,  王道档,  杨甬英,  黄玮

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文章导航 > 红外与激光工程  > 2017 >  46(9): 917001-0917001(10)
刘东, 严天亮, 王道档, 杨甬英, 黄玮. 条纹投影与相位偏折测量技术研究进展[J]. 红外与激光工程, 2017, 46(9): 917001-0917001(10). doi: 10.3788/IRLA201746.0917001
引用本文: 刘东, 严天亮, 王道档, 杨甬英, 黄玮. 条纹投影与相位偏折测量技术研究进展[J]. 红外与激光工程, 2017, 46(9): 917001-0917001(10). doi: 10.3788/IRLA201746.0917001
shu
Liu Dong, Yan Tianliang, Wang Daodang, Yang Yongying, Huang Wei. Review of fringe-projection profilometry and phase measuring deflectometry[J]. Infrared and Laser Engineering, 2017, 46(9): 917001-0917001(10). doi: 10.3788/IRLA201746.0917001
Citation: Liu Dong, Yan Tianliang, Wang Daodang, Yang Yongying, Huang Wei. Review of fringe-projection profilometry and phase measuring deflectometry[J]. Infrared and Laser Engineering, 2017, 46(9): 917001-0917001(10). doi: 10.3788/IRLA201746.0917001
shu

条纹投影与相位偏折测量技术研究进展

doi: 10.3788/IRLA201746.0917001
  • 1.

    浙江大学 光电科学与工程学院 现代光学仪器国家重点实验室,浙江 杭州 310027;

  • 2.

    中国计量大学 计量测试工程学院,浙江 杭州 310018;

  • 3.

    中国科学院长春光学精密机械与物理研究所 应用光学国家重点实验室,长春 吉林 130033

基金项目: 

国家自然科学基金（61475141）;应用光学国家重点实验室开放基金;浙江省自然科学基金（LY17E050014）

详细信息
    作者简介:

    刘东（1982-），男，副教授，博士生导师，博士，主要从事光电检测与遥感技术方面的研究。Email:liudongopt@zju.edu.cn

  • 中图分类号: TN247

Review of fringe-projection profilometry and phase measuring deflectometry

  • 1.

    State Key Laboratory of Modern Optical Instrumentation,College of Optical Science and Engineering,Zhejiang University,Hangzhou 310027,China;

  • 2.

    College of Metrology and Measurement Engineering,China Jiliang University,Hangzhou 310018,China;

  • 3.

    State Key Laboratory of Applied Optics,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China

  • 摘要: 条纹投影和相位偏折测量术可用于精确地测量待测物面形，在全场光学三维轮廓测量领域具有较好的发展前景。首先，介绍了条纹投影和相位偏折测量技术的基本原理，重点是这两种技术中的相位提取技术、摄像机定标技术等关键技术。其次，对条纹投影和相位偏折测量术这两种测量方法的异同点做了对比。最后，介绍了条纹投影和相位偏折测量技术在提升测量精度和速度方面的发展。为了提升测量精度，主要有校正条纹Gamma效应、提升相位提取精度、摄像机标定精度和相位-高度/梯度标定精度等途径；为了提升测量速度，主要有提升相位提取速度、相位解包裹速度等方法。
    Abstract: Fringe-projection profilometry and phase measuring deflectometry can realize high accurate measurement of three-dimensional shape, which has good development prospect in the full field three-dimensional profilometry. First, the measuring principles of fringe-projection profilometry and phase measuring deflectometry were introduced. Moreover, the technologies of phase extracting and camera calibration in fringe-projection profilometry and phase measuring deflectometry were also especially emphasized, which were key technologies. Then the similarities and differences of fringe-projection profilometry and phase measuring deflectometry were compared. What's more, the development direction and problems to be solved of enhancing the measurement accuracy and speed in fringe-projection profilometry and phase measuring deflectometry were introduced. In order to improve the measurement accuracy, main methods can be divided as follows:correcting the the Gamma effect of a digital projector and a digital camera, improving the phase extraction accuracy of the fringes, enhancing the camera calibration accuracy, phase-height/gradient calibration accuracy and other means. In order to improve the measurement speed, the phase extraction speed and the phase unwrapping speed were improved.
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出版历程
  • 收稿日期:  2017-01-10
  • 修回日期:  2017-02-20
  • 刊出日期:  2017-09-25

条纹投影与相位偏折测量技术研究进展

doi: 10.3788/IRLA201746.0917001
  • 1. 浙江大学 光电科学与工程学院 现代光学仪器国家重点实验室,浙江 杭州 310027;
  • 2. 中国计量大学 计量测试工程学院,浙江 杭州 310018;
  • 3. 中国科学院长春光学精密机械与物理研究所 应用光学国家重点实验室,长春 吉林 130033
    • 作者简介:

    刘东（1982-），男，副教授，博士生导师，博士，主要从事光电检测与遥感技术方面的研究。Email:liudongopt@zju.edu.cn

  • 收稿日期: 2017-01-10
  • 修回日期: 2017-02-20
  • 刊出日期: 2017-09-25
基金项目:

国家自然科学基金（61475141）;应用光学国家重点实验室开放基金;浙江省自然科学基金（LY17E050014）

  • 中图分类号: TN247

摘要: 条纹投影和相位偏折测量术可用于精确地测量待测物面形，在全场光学三维轮廓测量领域具有较好的发展前景。首先，介绍了条纹投影和相位偏折测量技术的基本原理，重点是这两种技术中的相位提取技术、摄像机定标技术等关键技术。其次，对条纹投影和相位偏折测量术这两种测量方法的异同点做了对比。最后，介绍了条纹投影和相位偏折测量技术在提升测量精度和速度方面的发展。为了提升测量精度，主要有校正条纹Gamma效应、提升相位提取精度、摄像机标定精度和相位-高度/梯度标定精度等途径；为了提升测量速度，主要有提升相位提取速度、相位解包裹速度等方法。

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