[1]
|
Zhang Liqiong, Wang Shaopu, Hu Yao, et al. Retrace error elimination for partial compensation digital Moire phase shifting interferometry[J]. Infrared and Laser Engineering, 2018, 47(1):0117005. (in Chinese) |
[2]
|
Wang Xiaokun. Fabrication and testing of an off-axis aspheric surface with abnormal shape[J]. Infrared and Laser Engineering, 2014, 43(9):2959-2963. (in Chinese) |
[3]
|
Han Zhigang, Chen Lei. Eight-step phase shifting algorithm for broadband light interferometry insensitive to envelop variation and phase shifting error[J]. Infrared and Laser Engineering, 2015, 44(4):1236-1242. (in Chinese) |
[4]
|
Wu Ting, Zou Yan, Li Zhitong, et al. Novel approach for high-precision measurement of micre refractive index difference of two transparent mediums[J]. Infrared and Laser Engineering, 2017, 46(4):0417005. (in Chinese) |
[5]
|
Bruning J H, Herriott D R, Gallagher J E, et al. Digital wavefront measuring interferometer for testing optical surfaces and lenses[J]. Applied Optics, 1974, 13(11):2693-2703. |
[6]
|
Deng Yong, Liu Ning, Cao Hongbei, et al. Nd:YAG laser feedback interference effects based PZT precision measurement technology and system[J]. Infrared and Laser Engineering, 2014, 43(10):3434-3438(in Chinese) |
[7]
|
Liu Q, Yue X, Li L, et al. Robust phase-shifting interferometry resistant to multiple disturbances[J]. Journal of Optics, 2018, 20(4):045701. |
[8]
|
Sun Qinyuan, Chen Lei, Zheng Donghui, et al. Dynamic Fizeau interferometer using low-coherence light source[J]. Infrared and Laser Engineering, 2018, 47(2):0220001. (in Chinese) |
[9]
|
Sasaki O, Okazaki H. Sinusoidal phase modulating interferometry for surface profile measurement[J]. Applied Optics, 1986, 25(18):3137-3140. |
[10]
|
He Guotian, Wang Xiangchao, Zeng Aijun. Real-time surface profile measurement using sinusoidal phase-modulating interferometry[J]. Acta Optica Sinica, 2007, 27(11):1997-2002. (in Chinese) |
[11]
|
Sasaki O, Xin J, Choi S, et al. Profile measurement of thin films by backpropagation of multiple-wavelength optical fields with two sinusoidal phase-modulating interferometers[J]. Optics Communications, 2015, 356:578-581. |
[12]
|
Feng F, Duan F J, Bo E, et al. Surface profile measuring system based on fringe projection and sinusoidal phase modulation[J]. Infrared and Laser Engineering, 2015, 44(12):3762-3768. |
[13]
|
Lv C, Duan F, Fu X, et al. Three-dimensional shape measurement with sinusoidal phase-modulating fiber-optic interferometer fringe[J]. Optical Fiber Technology, 2016, 29:20-27. |
[14]
|
Sasaki O, Okazaki H. Analysis of measurement accuracy in sinusoidal phase modulating interferometry[J]. Applied Optics, 1986, 25(18):3152-3158. |
[15]
|
De Groot P. Design of error-compensating algorithms for sinusoidal phase shifting interferometry[J]. Applied Optics, 2009, 48(35):6788-6796. |