Abstract: Flat response X-ray diodes have been widely used in large-scale laser devices at home and abroad for the measurement of angularly distributed X-ray radiation flux. In practical experiments, flat-response X-ray diodes measure radiation flux images that have a step change in a shaped pulse-driven radiation source. In order to ensure a good signal-to-noise ratio, a single signal will be connected to multiple channels of the oscilloscope, and then the signals of different channels will be processed, and the final image with good signal-to-noise ratio will be stitched. The research in this paper mainly introduced this data processing method and gave theoretical calculations. At the same time, a theoretical approximation and numerical simulation of a deviation in the calculation of the low temperature radiation flow reduction were made, and the relative uncertainty of the deviation was obtained. Coupled with the uncertainty of all factors, the curve of the overall uncertainty of the flat-response X-ray diode as a function of the radiation temperature was obtained, which realized precise diagnosis and completed the experimental needs for diagnosis.