Volume 49 Issue S1
Sep.  2020
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Zhang Lu, Zhang Lei, Lin Guohua. Simulation analysis of Dewar optical characteristics influenced by surface defects on optical elements[J]. Infrared and Laser Engineering, 2020, 49(S1): 20200113. doi: 10.3788/IRLA20200113
Citation: Zhang Lu, Zhang Lei, Lin Guohua. Simulation analysis of Dewar optical characteristics influenced by surface defects on optical elements[J]. Infrared and Laser Engineering, 2020, 49(S1): 20200113. doi: 10.3788/IRLA20200113

Simulation analysis of Dewar optical characteristics influenced by surface defects on optical elements

doi: 10.3788/IRLA20200113
  • Received Date: 2020-05-11
  • Rev Recd Date: 2020-06-21
  • Publish Date: 2020-09-22
  • Surface defects and contamination of optical elements may reduce the infrared detector ability. There are different level of surface defects on the window and filter in dewar. Optical simulation software LightTools was used to calculate the optical parameter. Meanwhile, to evaluate the optical characteristics of the systems, the concepts of stray radiation coefficient and signal-to-clutter ratio were introduced, so the defect tolerance can be reasonably judged. Then, when the filter position changed, the effect of surface defects on Dewar was analyzed by simulation. The results show that with the level of surface defects increasing, the non-uniformity of the image increased and the signal strength decreased. And at the same grade of defects, the closer the filter is to the chip, the more defects affect the Dewar optical characteristics, as a result, when encapsulating Dewar, it is important to strictly control the surface defect tolerance and arrange the location of the filter reasonably.
  • [1] Xiao Jing, Zhang Bin. Influence of the optical components contamination on the signal to noise ratio in infrared optical systems[J]. Infrared and Laser Engineering, 2010, 41(4):1010-1016. (in Chinese)肖静,张彬. 光学元件污染对红外光学系统信噪比的影响分析[J]. 红外与激光工程, 2012, 41(4):1010-1016.
    [2] Xia Xinlin, Tan Heping, Yu Qizheng, et al. Using Monte-Carlo method to calculate the strary light of an infrared optical system[J]. Chinese Journal of Computational Physics, 1997, 14(4-5):680-681, 679. (in Chinese)夏新林,谈和平,余其铮, 等. 用蒙特卡洛方法计算红外光学系统的杂散光[J]. 计算物理, 1997, 14(4-5):680-681, 679.
    [3] Liu Gen, Xiao Jing. Influence of surface characteristics of components on the stray radiation performance in infrared optical systems[J]. Optical Technique, 2011, 12(37):122-126. (in Chinese)刘根,肖静. 元件表面特性对红外系统杂散辐射性能的影响[J]. 光学技术, 2011, 12(37):122-126.
    [4] Zhang Faqiang, Zhang Weiguang, Wan Wenbo. Research on stray radiation of infrared detection optical system based on ray-tracing[J]. Infrared and Laser Engineering, 2019, 48(9):0904006. (in Chinese)张发强,张维光, 万文博. 基于光线追迹的红外探测光学系统杂散辐射研究[J]. 红外与激光工程, 2019, 48(9):0904006.
    [5] You Xinghai, Hu Xiaochuan, Peng Jiaqi, et al. Effect of defects of component on stray radiation characteristics of infrared optical systems[J]. Infrared and Laser Engineering, 2017, 48(1):0120004. (in Chinese)游兴海,胡小川, 彭家琪, 等. 元件缺陷对红外光学系统杂散辐射特性的影响[J]. 红外与激光工程, 2017, 48(1):0120004.
    [6] Xu Quanchun. Research and analysis on stray light and suppression methods of satellite terminal in satellite-to-ground laser communications[D]. Harbin:Harbin Institute of Technology, 2014. (in Chinese)胥全春.星地激光通信星上终端杂散光分析及抑制方法研究[D]. 哈尔滨:哈尔滨工业大学, 2014.
    [7] Niu Jinxing. Stray light analysis and suppressing of infrared detecting system[D]. Xi'an:Xi'an Institute of Optics and Precision Mechanics of Chinese Academy of Sciences, 2010. (in Chinese)牛金星. 红外探测系统杂散辐射的分析与抑制技术研究[D]. 西安:中国科学院西安光学精密机械研究所,2010.
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Simulation analysis of Dewar optical characteristics influenced by surface defects on optical elements

doi: 10.3788/IRLA20200113
  • North China Research Institute of Electro-Optics, Beijing 100015, China

Abstract: Surface defects and contamination of optical elements may reduce the infrared detector ability. There are different level of surface defects on the window and filter in dewar. Optical simulation software LightTools was used to calculate the optical parameter. Meanwhile, to evaluate the optical characteristics of the systems, the concepts of stray radiation coefficient and signal-to-clutter ratio were introduced, so the defect tolerance can be reasonably judged. Then, when the filter position changed, the effect of surface defects on Dewar was analyzed by simulation. The results show that with the level of surface defects increasing, the non-uniformity of the image increased and the signal strength decreased. And at the same grade of defects, the closer the filter is to the chip, the more defects affect the Dewar optical characteristics, as a result, when encapsulating Dewar, it is important to strictly control the surface defect tolerance and arrange the location of the filter reasonably.

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