Volume 43 Issue 10
Nov.  2014
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Zhou Yue, Yan Feng, Zhang Mingchao. Development of measurement instrument for photoelectric parameters of CCD[J]. Infrared and Laser Engineering, 2014, 43(10): 3451-3456.
Citation: Zhou Yue, Yan Feng, Zhang Mingchao. Development of measurement instrument for photoelectric parameters of CCD[J]. Infrared and Laser Engineering, 2014, 43(10): 3451-3456.

Development of measurement instrument for photoelectric parameters of CCD

  • Received Date: 2014-02-05
  • Rev Recd Date: 2014-03-04
  • Publish Date: 2014-10-25
  • A measurement system for testing the photoelectric parameters of CCD was developed. It can realize automatic testing for the photoelectric parameters of various types of linear or area CCD, including invalid pixels, relative spectral responsivity, saturation irradiance, responsivity, equivalent noise irradiance, dynamic range, linearity, threshold illuminance, nonuniformity. The measurement system for relative spectral responsivity of CCD was based on the method of direct comparison of single optic path. The other parameters measurement system was built on a special designed integrating sphere light source. Four halogen lights was plant in four secondary integrating spheres, then cascaded with main integrating sphere using high-precision electric diaphragm. After calibrated, the light meter planted on the wall of main integrating sphere can test the luminance of export in real-time. The color temperature of the light source unchanged, the luminance of export was uniform, and can adjust in a large dynamic range continuously. The demand of testing the photoelectric parameters of CCD was satisfied. The photoelectric parameters of CCD47-10B was tested, and then the uncertainty of those systems was analyzed. Results indicate that the spectrum range of measurement system of relative spectral responsivity is 400-1 000 nm, the uncertainty is 4.37%. At the distance of 23 mm from exit port of source in measurement system for photoelectric transform parameters of CCD, the dynamic range of luminance was 0-235 lx, and the irradiance uniformity within 80 mm has reached 99%, the uncertainty is 4.9%. The measurement system can be used in testing the photoelectric parameters of aerospace-grade CCD and filtering it.
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Development of measurement instrument for photoelectric parameters of CCD

  • 1. State Key Laboratory of Applied Optics,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China

Abstract: A measurement system for testing the photoelectric parameters of CCD was developed. It can realize automatic testing for the photoelectric parameters of various types of linear or area CCD, including invalid pixels, relative spectral responsivity, saturation irradiance, responsivity, equivalent noise irradiance, dynamic range, linearity, threshold illuminance, nonuniformity. The measurement system for relative spectral responsivity of CCD was based on the method of direct comparison of single optic path. The other parameters measurement system was built on a special designed integrating sphere light source. Four halogen lights was plant in four secondary integrating spheres, then cascaded with main integrating sphere using high-precision electric diaphragm. After calibrated, the light meter planted on the wall of main integrating sphere can test the luminance of export in real-time. The color temperature of the light source unchanged, the luminance of export was uniform, and can adjust in a large dynamic range continuously. The demand of testing the photoelectric parameters of CCD was satisfied. The photoelectric parameters of CCD47-10B was tested, and then the uncertainty of those systems was analyzed. Results indicate that the spectrum range of measurement system of relative spectral responsivity is 400-1 000 nm, the uncertainty is 4.37%. At the distance of 23 mm from exit port of source in measurement system for photoelectric transform parameters of CCD, the dynamic range of luminance was 0-235 lx, and the irradiance uniformity within 80 mm has reached 99%, the uncertainty is 4.9%. The measurement system can be used in testing the photoelectric parameters of aerospace-grade CCD and filtering it.

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