贾冰, 曹国华, 吕琼莹, 丁红昌. 多谱段共孔径跟踪/引导系统光学设计[J]. 红外与激光工程, 2017, 46(2): 218001-0218001(7). DOI: 10.3788/IRLA201746.0218001
引用本文: 贾冰, 曹国华, 吕琼莹, 丁红昌. 多谱段共孔径跟踪/引导系统光学设计[J]. 红外与激光工程, 2017, 46(2): 218001-0218001(7). DOI: 10.3788/IRLA201746.0218001
Jia Bing, Cao Guohua, Lv Qiongying, Ding Hongchang. Optical design of tracking/guiding system with multi-spectrum and common aperture[J]. Infrared and Laser Engineering, 2017, 46(2): 218001-0218001(7). DOI: 10.3788/IRLA201746.0218001
Citation: Jia Bing, Cao Guohua, Lv Qiongying, Ding Hongchang. Optical design of tracking/guiding system with multi-spectrum and common aperture[J]. Infrared and Laser Engineering, 2017, 46(2): 218001-0218001(7). DOI: 10.3788/IRLA201746.0218001

多谱段共孔径跟踪/引导系统光学设计

Optical design of tracking/guiding system with multi-spectrum and common aperture

  • 摘要: 共孔径光学结构可以充分利用长焦距、大孔径光学系统高分辨率的特点,是光学系统发展的重要方向之一。文中设计了一套可见光成像、激光成像和激光测高共孔径的跟踪引导系统。共孔径设计结合了高分辨率的可见光系统与高测量精度的激光系统,使系统既可以获得目标的高清图像,又可以得到目标的相对位置信息。同时,共孔径光学结构可以压缩系统尺寸,降低光学系统在跟踪过程中的转动惯量,有利于系统的整体实现。可见光子系统的焦距1 200 mm,F数6,视场1.2;1 064 nm激光成像子系统焦距1 500 mm,F数7.5。各系统的成像质量均接近衍射极限,并通过公差分析验证了系统的公差分配结果。

     

    Abstract: One of the important direction of the optical system is the co-aperture optical system, which takes advantage of optical system characters with long-focus and high resolution. This paper designed a tracking guiding system whose aperture of the optical system for visible light imaging, laser imaging and laser ranging was shared. The co-aperture design combined the high resolution visible light system with high resolution laser system, which made the system not only obtain high-definition images, but also get the relative location information. The co-aperture optical system could compress system size, reduce the rotational inertia when the optical system was in the process of tracking for the overall implementation of the system. The focal length of visible light subsystem is 1 200 mm; F number is 6; field of 1.2. The focal length of laser imaging subsystem is 1 500 mm; F number is 7.5. Each system imaging quality is close to the diffraction limit, and tolerance allocation results is verified by tolerance analysis.

     

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