周恩源, 刘丽辉, 刘岩, 曹振. 近红外大数值孔径平场显微物镜设计[J]. 红外与激光工程, 2017, 46(7): 718006-0718006(7). DOI: 10.3788/IRLA201746.0718006
引用本文: 周恩源, 刘丽辉, 刘岩, 曹振. 近红外大数值孔径平场显微物镜设计[J]. 红外与激光工程, 2017, 46(7): 718006-0718006(7). DOI: 10.3788/IRLA201746.0718006
Zhou Enyuan, Liu Lihui, Liu Yan, Cao Zhen. Design of high NA flat-field microscope objective for near infrared[J]. Infrared and Laser Engineering, 2017, 46(7): 718006-0718006(7). DOI: 10.3788/IRLA201746.0718006
Citation: Zhou Enyuan, Liu Lihui, Liu Yan, Cao Zhen. Design of high NA flat-field microscope objective for near infrared[J]. Infrared and Laser Engineering, 2017, 46(7): 718006-0718006(7). DOI: 10.3788/IRLA201746.0718006

近红外大数值孔径平场显微物镜设计

Design of high NA flat-field microscope objective for near infrared

  • 摘要: 为满足飞秒激光微纳加工系统对高加工精度和大加工范围的需求,首先确定了该系统的重要组成部分-无限共轭距显微物镜所需具备的特性及设计指标。依据薄透镜组的初级像差理论,针对飞秒激光波长推导出光学系统为校正匹兹凡场曲和二级光谱所需满足的条件。该镜头由11片球面透镜构成,所选用材料皆为国产玻璃,同时避免三胶合结构的使用。设计了一套工作波长为785~815 nm,数值孔径为0.9,像方视场为22.5 mm,放大倍率为40的近红外平场复消色差显微物镜。设计结果表明:该镜头的MTF良好,全视场波像差均小于0.08,各种几何像差均远小于公差且满足平场和复消色差条件,能量集中度高。使用补偿器放松材料公差、加工公差和装调公差,公差分配后全视场RMS波像差小于0.09,满足实际应用要求。

     

    Abstract: To meet the requirements of femtosecond laser micro-nanofabrication systems for high precision and wide region, the features and design specifications of infinity microscope objectives which were important components of the systems were determined. Based on the theory of primary aberration of thin lens system, the conditions to meet were concluded to correct Petzval curvature and second order spectrum for femtosecond wavelength. The objective consisted of 11 spherical lens, and all materials were glass made in China, and the use of cemented lens composed of three lens was avoided. A near infrared flat-field microscope objective, whose working wavelength was 785-815 nm, numerical aperture was 0.9, field of view in image space was 22.5 mm, magnification was 40, was designed. Designing results show that the objective has excellent MTF, RMS wavefront errors of all fields are less than 0.08, and various geometrical aberrations are deeply under tolerances, the results meet the conditions of flat field and apochromatism, and energy concentration is high. Compensators are used to slacken material tolerance, manufacturing tolerances and alignment tolerances. RMS wavefront errors of all fields get less than 0.09 after tolerances attribution and the objective can be applied actually.

     

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