车兴森, 侯立飞, 杨轶濛, 杜华冰, 杨国洪, 韦敏习. 用于平响应X光探测器的复合滤片参数优化[J]. 红外与激光工程, 2017, 46(10): 1017008-1017008(5). DOI: 10.3788/IRLA201776.1017008
引用本文: 车兴森, 侯立飞, 杨轶濛, 杜华冰, 杨国洪, 韦敏习. 用于平响应X光探测器的复合滤片参数优化[J]. 红外与激光工程, 2017, 46(10): 1017008-1017008(5). DOI: 10.3788/IRLA201776.1017008
Che Xingsen, Hou Lifei, Yang Yimeng, Du Huabing, Yang Guohong, Wei Minxi. Parameter optimization of compound filters applied for flat-response X-ray detectors[J]. Infrared and Laser Engineering, 2017, 46(10): 1017008-1017008(5). DOI: 10.3788/IRLA201776.1017008
Citation: Che Xingsen, Hou Lifei, Yang Yimeng, Du Huabing, Yang Guohong, Wei Minxi. Parameter optimization of compound filters applied for flat-response X-ray detectors[J]. Infrared and Laser Engineering, 2017, 46(10): 1017008-1017008(5). DOI: 10.3788/IRLA201776.1017008

用于平响应X光探测器的复合滤片参数优化

Parameter optimization of compound filters applied for flat-response X-ray detectors

  • 摘要: 在间接驱动的激光惯性约束聚变实验中,激光辐照产生的X射线能流的测量非常重要,它可以推测出黑腔的辐射温度和激光腔靶的耦合效率,一般通过平响应X射线探测器得到不同角分布的辐射流数据。通过对平响应复合滤片的结构参数进行优化设计,提高了平响应X射线探测器的测量精度。研究了复合滤片中薄金层、厚金层和孔面积比等结构参数对X射线探测器响应平整度的影响规律。从实验结果中可以得出:滤片和金阴极的标定数据和理论结果基本一致,并且薄金层的厚度对探测器整体响应的平整度起到主要作用,厚金层厚度和孔面积比影响较小,优化后探测器的平响应度达到5%,与理论设计相一致,此时的薄金层厚度、厚金层厚度和孔面积比分别为50 nm、380 nm和1:6.1。

     

    Abstract: The absolute measurement of thermal X-ray flux from a hohlraum is essential to get the radiation temperature and the laser-hohlraum coupling efficiency in the experiments of indirect-driven inertial confinement fusion (ICF), which can be measured by a flat response X-ray detector. The configuration parameters of flat-response compound filters were optimized to enhance the performance of flat-response X-ray detectors. The effects of thin layer thickness, thick layer thickness and hole area ratio on response flatness of detectors were investigated. The calculated results agree well with the calibrated data. From the results, it can be found that the thin layer thickness plays a primary role in performance of detectors while thick layer thickness and hole area ration take a minor role. Besides, the detectors show a best response flatness less than 5% which reaches the limit value of theory as the thin layer thickness, thick layer thickness and hole area ratio are 50 nm, 380 nm and 1:6.1.

     

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