高超, 陈芳, 孙海洋. 大型空间相机主承力板检测结构设计及误差分析[J]. 红外与激光工程, 2020, 49(10): 20200046. DOI: 10.3788/IRLA20200046
引用本文: 高超, 陈芳, 孙海洋. 大型空间相机主承力板检测结构设计及误差分析[J]. 红外与激光工程, 2020, 49(10): 20200046. DOI: 10.3788/IRLA20200046
Gao Chao, Chen Fang, Sun Haiyang. Design and error analysis of measurement structure for large aperture space camera mainboard[J]. Infrared and Laser Engineering, 2020, 49(10): 20200046. DOI: 10.3788/IRLA20200046
Citation: Gao Chao, Chen Fang, Sun Haiyang. Design and error analysis of measurement structure for large aperture space camera mainboard[J]. Infrared and Laser Engineering, 2020, 49(10): 20200046. DOI: 10.3788/IRLA20200046

大型空间相机主承力板检测结构设计及误差分析

Design and error analysis of measurement structure for large aperture space camera mainboard

  • 摘要: 主承力板作为空间相机的核心承力部件,需要具备极高的尺寸精度和结构稳定性,常规的检测方法和装夹方式无法满足产品使用要求。根据某大口径相机主承力板的结构形式和指标要求,结合现有测量设备的容纳能力,选择了卧式放置的方式进行关键部位的平面度检测;引入准运动学支撑概念,主承力板使用3个逆Bipod支撑以避免装夹变形及装配变形,设计并制造了专用检测结构;以主承力板基准面PV值为评价指标,使用ABAQUS有限元软件和Matlab软件进行仿真计算,确定检测时的卸载力位置和大小。实验结果表明,使用检测结构得出的基准面平面度检测误差小于2 μm,提升了三坐标设备的检测能力,有广泛的应用前景。

     

    Abstract: High precision and stability are demanded for mainboard as a core construction of high resolution space camera, thus, traditional measurement methods could not match the application requirements. According to the structure and specification of the mainboard used in a large aperture camera and the capability of measurement equipment, horizontal placement was adopted for flatness test of mainboard datum plane using gantry coordinate measuring machine (CMM). The concept of quasi-kinematic mount was introduced, the mainboard was supported by 3 inverted Bipods to avoid clamping and assembly deformation, a specialized measurement structure was designed and manufactured as well. The position and magnitude of unloading force were confirmed by numerical simulation based on ABAQUS and Matlab with an index of datum plane's flatness error (PV). The results show that using designed measurement structure datum plane's flatness error is less than 2 μm. This method promotes the capability of CMM for measurement of large precise objects and has widely application prospect.

     

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