金刚石膜表面微结构红外增透性能研究

Study on infrared anti-reflection performance of diamond film with surface microstructure

  • 摘要: CVD金刚石是一种性能优异的红外光学窗口材料,但其在红外波段的理论透过率仅能实现约71%。通过表面亚波长结构设计可进一步增强CVD金刚石膜的光学透过性能。该研究首先通过理论模拟,建立了金刚石微结构特征与光学增透之间的定量关系。基于此为指导,探讨了在具有微结构硅片表面,采用MPCVD方法复制生长出具有微结构的金刚石自支撑光学级薄膜,用于提升金刚石膜在红外波段的透过率。采用扫描电镜(SEM)观察了原始硅片和金刚石表面及微结构形貌,通过拉曼散射光谱评估了金刚石的生长质量及形核层影响,采用红外光谱仪测试了金刚石红外透过率。结果显示,单面构筑微结构后,金刚石膜在8~12 μm波段的透过率可从70%提升至76%,说明表面微结构能显著提升金刚石膜的光学透过性能。非金刚石形核层以及表面微结构的完整性不足可能是导致实验结果与理论模拟结果具有一定偏差的主要原因。

     

    Abstract: CVD diamond is an excellent material for infrared optical window, but its theoretical transmittance in the infrared band can only achieve about 71%. The optical transmission performance of the CVD diamond film can be improved by the surface sub-wavelength structure design. In this study, the quantitative relationship between diamond microstructure characteristics and optical antireflection was established through theoretical simulation. According to the theory guidance, the CVD diamond film with surface microstructure was fabricated by replicating the Si substrate through MPCVD method to improve the transmittance of diamond in the infrared band. Scanning electron microscope (SEM) was used to observe the surface and microstructure of the original silicon wafer and diamond. The growth layer quality and the nucleation layer quality of diamond were both evaluated by Raman scattering spectrum. Infrared spectrometer was used to test the infrared transmittance of diamond film. The results show that after constructing the microstructure on one side, the transmittance of the diamond film in the 8-12 μm band can be increased from 70% to 76%, which means the surface microstructure can significantly improve the optical transmission performance of diamond film. The non-diamond nucleation layer and the insufficient integrity of surface microstructure may be the main reason for the gap between the experimental results and the theoretical simulation results.

     

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