CCD损伤进程中光学成像系统猫眼回波特性研究

Cat eye echo characteristics of optical imaging system in CCD damage process

  • 摘要: 建立了CCD损伤进程中光学成像系统猫眼回波探测系统,记录了CCD损伤进程中光学成像系统猫眼回波功率与猫眼回波偏振度数据并绘制了变化曲线,分析了猫眼回波特性的变化机理、CCD损伤状态与猫眼回波功率、偏振度变化之间的联系,研究得出:光学成像系统CCD探测器件受脉冲激光辐照产生点损伤、线损伤至全靶面损伤进程中,猫眼回波功率、偏振度变化与CCD损伤状态变化没有良好的相关性,提高损伤激光能量使CCD受到首个脉冲辐照时完全损伤,在0~8个脉冲损伤进程中,猫眼回波功率与偏振度先增大后减小,再增大最后不断减小,可以此规律对CCD是否完全损伤进行判断。

     

    Abstract: The cat eye echo detection system of optical imaging system in the process of CCD damage was established. The data of cat eye echo power and degree of polarization of optical imaging system during CCD damage process were recorded and the curve of change was drawn. The change mechanism of cat eye echo characteristics, the relationship between CCD damage state and the change of cat eye echo power and degree of polarization were analyzed. The results show that there is no good correlation between the change of cat eye echo power and degree of polarization and the change of CCD damage state during the process of point damage, line damage and full target damage of CCD detector in optical imaging system by pulsed laser irradiation. The CCD is completely damaged when the first pulse is irradiated by increasing the damage laser energy. In the 0-8 pulse damage process, the cat eye echo power and degree of polarization increase first, then decrease, then increase and finally decrease, which can be used to judge whether CCD is completely damaged.

     

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