陈加伟, 李豫东, 玛丽娅, 李钰, 郭旗. 850 nm垂直腔面发射激光器的辐射效应[J]. 红外与激光工程, 2022, 51(5): 20210326. DOI: 10.3788/IRLA20210326
引用本文: 陈加伟, 李豫东, 玛丽娅, 李钰, 郭旗. 850 nm垂直腔面发射激光器的辐射效应[J]. 红外与激光工程, 2022, 51(5): 20210326. DOI: 10.3788/IRLA20210326
Chen Jiawei, Li Yudong, Ma Liya, Li Yu, Guo Qi. Radiation effect of 850 nm vertical-cavity surface-emitting laser[J]. Infrared and Laser Engineering, 2022, 51(5): 20210326. DOI: 10.3788/IRLA20210326
Citation: Chen Jiawei, Li Yudong, Ma Liya, Li Yu, Guo Qi. Radiation effect of 850 nm vertical-cavity surface-emitting laser[J]. Infrared and Laser Engineering, 2022, 51(5): 20210326. DOI: 10.3788/IRLA20210326

850 nm垂直腔面发射激光器的辐射效应

Radiation effect of 850 nm vertical-cavity surface-emitting laser

  • 摘要: 为了探究850 nm高速垂直腔面发射激光器(Vertical-Cavity Surface-Emitting Laser,VCSEL)在空间辐射环境中的退化规律与机制,开展了10 MeV质子和γ-射线辐照实验,获得了光功率和阈值电流退化规律,分析了辐射导致VCSEL参数退化的物理机理,此外,还开展了236 h的电注入退火研究。研究结果表明:VCSEL对γ射线导致的总剂量效应不敏感,且在一定剂量范围内光电特性由于沉积能量促进了量子阱界面附近的晶体有序而产生了一定程度的恢复:但是在质子辐照下,VCSEL的阈值电流和外量子效率发生了不同程度的退化,计算获得阈值电流损伤因子为1.468×10−15 cm2/p。经过20 mA注入增强退火后,阈值电流恢复了20%,25 mA注入电流下,光输出功率恢复了10%。阈值电流和外量子效率的退化归因于质子辐照引入的非辐射复合中心。这些实验结果为VCSEL及包含VCSEL的数据通信与仪器的系统在恶劣空间辐射环境下的应用提供支持。

     

    Abstract: To explore the degradation and mechanism of 850 nm high-speed vertical-cavity surface-emitting laser in space radiation environment, the degradation of light output power and threshold current were obtained by Gamma ray and 10 MeV proton irradiation. The physical mechanism of VCSEL parameter degradation caused by radiation was analyzed. In addition, 236 h forward-bias annealing research was also carried out. The results show that VCSEL is not sensitive to the total dose effect caused by gamma rays, the photoelectric properties have a certain degree of recovery due to the deposition energy promoting the order of the crystals near the quantum well interface within a certain dose range. But threshold current and external quantum efficiency of VCSEL are degraded in varying degrees under proton irradiation, the threshold current damage factor is calculated to be 1.468 × 10−15 cm2/p. After 20 mA forward-bias annealing, the threshold current is restored by 20%, and the optical output power is restored by 10% at 25 mA injection current. The degradation of threshold current and external quantum efficiency is attributed to the non-radiative recombination center introduced by proton irradiation. These results provide support for the application of VCSEL and the data communication and instrument system containing VCSEL in harsh space radiation environment.

     

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