Abstract: Holographic three-dimensional deformation test has important significance in the military, industrial test, however its applications are limited because of the requirements of traditional holographic recording, development, fixing, reconstruction and home position. In this paper, applying the charge-coupled device(CCD) digital holography was realized. It avoided not only the developing, fixing processes of traditional hologram recording material, but also the shortcoming of nonlinear recording of holographic material. Based on double exposure holographic interferometry and four-step phase shift method principle the digital phase shift was achieved, replaced the traditional mechanical phase shift method with piezoelectric translator, and the 3D deformation of an object was tested. From the 2D contour map and 3D plot of object deformation, the size, shape, and deformation direction of the deformed object could be interpreted. A lot of experiment results show that these method can not only simplify the optical layout of holographic interference testing, but also easy operate and increase measure precision. The precision can be up to 1/10 wavelength.