Abstract: Laser conditioning technique is an effective method to improve the laser induced damage threshold (LIDT) of the optical elements. In this paper, the influence of N-on-1, R-on-1 and raster scan laser conditioning techniques with sing and multi-steps of energy increments on the HfO2/SiO2 high reflection films at 1 064 nm were investigated. Moreover, the 1-on-1 test was adopted to evaluate the laser conditioning effects of different techniques. The results indicate that the damage probability data deviation, fitting tolerance and LIDT deviation of 1-on-1 curves were able to characterize the reproducibility of measurements. Also, it is found that the single step modes of N-on-1 are less effective on improving the laser resistance ability than multi-steps, while the slight differences are difficult to distinguish between the single steps or multi-steps modes due to the uncertainty and deviation of 1-on-1 tests. Furthermore, the successive increasing energy steps will only lead to the improvement of the nonzero damage threshold except the 0% damage threshold.