基于铟镓砷材料的新型太赫兹/亚毫米波探测器研究
New type terahertz/sub-millimeter wave detector based on InGaAs layers
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摘要: 对一种基于生长在半绝缘InP衬底上InGaAs外延材料的新型太赫兹室温探测器进行研究。首先在HFSS理论计算的基础上对器件天线阻抗、驻波比、辐射方向图等特性参数进行分析。其次,通过光刻、腐蚀、溅射、点焊等工艺制作出对称金属电极天线耦合的太赫兹探测器件。结合自己搭建的0.037 5 THz器件响应测试系统,得到铟镓砷太赫兹探测器件在不同偏置电流和不同调制频率下的器件响应曲线。结果表明器件具有明显的光电信号和快的响应速度。通过利用高莱探测器进行标定,得到器件在0.037 5 THz时的电压灵敏度优于6 V/W,器件噪声等效功率NEP优于1.610-9 W/Hz1/2,器件响应时间优于300 s。Abstract: A brand new type of terahertz/sub-millimeter wave detector based on InGaAs material grown on semi-insulate InP substrate was proposed with an Metal-Semiconductor-Metal(MSM) structure. High Frequency Structural Simulator(HFSS) software was firstly used to characterize the metallic planar antenna by calculating its resistance, standing-wave ratio(SWR), and the radiation pattern. Detectors with symmetrical metallic antenna were fabricated by a serious of technical process mainly including photolithograph, etching, and sputtering. Photoresponse of the detector with respect to the bias current and the modulation frequency was measured by a homemade measure system with a 0.037 5 THz Gunn oscillator terahertz source. The results show large photovoltage signal and fast respond speed (300 s) of the device. The voltage sensitivity of the detector at 0.037 5 THz reaching to 6 V/W was further obtained by the calibration of a Golay cell detector. And the noise equivalent power(NEP) at this frequency was 1.610-9 W/Hz1/2.