X射线分光晶体高阶衍射效率标定方法

Calibration of high order integral diffraction coefficient for X-ray plane crystal

  • 摘要: 包含高阶衍射的X射线分光晶体积分衍射效率是X射线光谱准确辨识、X射线分光晶体性能研究、X射线光谱定量测量和高分辨X射线单能成像的基础。基于X射线衍射仪,选择适当厚度的镍滤片和控制X射线管电压,极大地抑制Cu K及韧致辐射,将X射线管光源Cu K单能化。以常用的X射线分光晶体季戊四醇PET(002)为样品,对X射线分光晶体的高阶积分衍射效率进行标定其结果表明,在 Cu K能点,PET(002)晶体的积分衍射效率,二阶为一阶的14.36%,三阶为一阶的4.07%;Cu K1最大峰值比,二阶衍射为一阶的7.7%,三阶衍射为一阶的1.3%。基于X射线衍射仪的X射线分光晶体高阶衍射效率实验标定具有快速高效、方便灵活的特点。

     

    Abstract: Integral diffraction coefficient including high diffraction order is the basis of identification of X-ray line, study of X-ray crystal characteristy, X-ray line intensity quantitative measurement and X-ray monochromatic image diagnosis. On the automatic X-ray diffractometer (XRD), based on the stability and precision control of and 2 goniometer, special plane crystal holder was made. Bremsstrahlung and Cu K line were attenuated for 5 orders by 40 m-thick pure Nickel filter in 15 kV and 20 mA supply to X-ray Cu tube, X-ray source of Cu taget is to be Cu K monochromatic source, transmission coefficient of Nickel filter is the criterion of Cu K monochromatic source. For X-ray Pentaerythritol(002) crystal,integral diffraction coefficient of 1-3 order diffraction on Cu K energy were calibrated. The results show that integral diffraction coefficient of the 2nd order and the 3rd order is only 14.36% and 4.07%, the Cu K1 intensity ratio of the 2nd order and the 3rd order is only 7.7% and 1.3% compared with the 1st order diffraction. This kind of calibration is efficient and convenient on XRD in common laboratory.

     

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