Abstract: The VO2/TiO2 films were fabricated by a sol-gel method on the(001) oriented cleavage surface of muscovite slices. The X-ray diffractometer(XRD), X-ray photoelectron spectroscopy(XPS) and atomic force microscopy(AFM) were used to investigate the microstructure and describe the morphology of the films. The infrared transmittance spectrums of the VO2/TiO2 films at different temperatures were determined by in-situ Fourier transform infrared spectroscopy(FTIR), and the spectrums were used to analyze the thermochromic properties of the VO2/TiO2 films. The results show that the composite films are preferred VO2(011)/TiO2(101) orientated on the muscovite substrate with compact structure and smooth surface. The VO2/TiO2 films exhibit a significant infrared optic switching of 75.5% at the wavelength of 4 m during the metal-semiconductor phase transition(MST) process. The phase transition process of the composite film is quite sharp with a dTr/dT of 15.7%/℃, and the hysteresis width of films decreases to 8 ℃.