刘华松, 余俊宏, 冷健, 庄克文, 季一勤. 毫米波在SiO2基底材料中的传播特性[J]. 红外与激光工程, 2014, 43(4): 1145-1149.
引用本文: 刘华松, 余俊宏, 冷健, 庄克文, 季一勤. 毫米波在SiO2基底材料中的传播特性[J]. 红外与激光工程, 2014, 43(4): 1145-1149.
Liu Huasong, Yu Junhong, Leng Jian, Zhuang Kewen, Ji Yiqin. Millimeter-wave propagation characteristics in SiO2 fundus materials[J]. Infrared and Laser Engineering, 2014, 43(4): 1145-1149.
Citation: Liu Huasong, Yu Junhong, Leng Jian, Zhuang Kewen, Ji Yiqin. Millimeter-wave propagation characteristics in SiO2 fundus materials[J]. Infrared and Laser Engineering, 2014, 43(4): 1145-1149.

毫米波在SiO2基底材料中的传播特性

Millimeter-wave propagation characteristics in SiO2 fundus materials

  • 摘要: 红外/毫米波分频器件是红外/毫米波复合探测系统的关键器件之一。利用电磁波干涉理论计算和分析了介质材料特征参数对毫米波透射、反射和吸收性能的影响。针对工作频率为35GHz的电磁波,给出了介质材料厚度设计的准则,分析了SiO2材料不同物理厚度和物理厚度偏差对毫米波传输性能的影响。分析结果表明:基底物理厚度越大,基底物理厚度偏差对毫米波透射、反射和吸收性能的影响就越大,要求也越精确。对红外/毫米波分频器件的设计有一定的参考价值。

     

    Abstract: IR/MMW frequency divider is one of the key devices of IR/MMW composite-detected system. The influence of dielectric material characteristic parameters on millimeter-wave transmission, reflection and absorption properties were analyzed and calculated, which was based on theory of electromagnetic interference. The dielectric material thickness design guidelines in 35 GHz was put forward, the influence of SiO2 material different physical thickness and physical thickness deviation on the millimeter-wave transmission properties was analyzed. The results indicate that with the increase of physical thickness, the physical thickness deviation has more influence on millimeter-wave transmission, reflection and absorption properties, the accuracy requirements for physical thickness deviation becomes higher. This article have a certain reference value about the design of IR/MMW frequency divider.

     

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