Influence mechanism of CMOS sensor radiation damage on the performance of visual position and attitude measurement system

The vision position and attitude measurement system is an important part of the service system on orbit. Accurate measurements of the position and attitude of target spacecraft components are the prerequisite for successful completion of service operations on orbit. However, in the space radiation environment, the photoelectric sensitive parameters of the CMOS image sensor are attenuated under the irradiation of the space charged particles, which results in the performance degradation of the visual position attitude measurement system. After the CMOS sensor is irradiated by 3.0 MeV proton, the standard deviation of position calculation increases rapidly with the increase of irradiation fluence. When the proton fluence is 7.361010 p/cm2, the standard deviation of position calculation is 4.41-17.86 times as much as before irradiation. The standard deviation of attitude calculation decreases with the increase of radiation fluence. When the proton fluence is 7.361010 p/cm2, the standard deviation of attitude calculation is 2.76-5.85 times as much as before irradiation. The accuracy of attitude calculation is better than that of position calculation. That is to say, the proton irradiation has a greater effect on the position calculation accuracy of the visual sensor. The results lay the foundation for mastering the space radiation effect of vision system.