Pan An, Yao Baoli. High-throughput and fast-speed Fourier ptychographic microscopy:A review[J]. Infrared and Laser Engineering, 2019, 48(6): 603012-0603012(19). DOI: 10.3788/IRLA201948.0603012
Citation: Pan An, Yao Baoli. High-throughput and fast-speed Fourier ptychographic microscopy:A review[J]. Infrared and Laser Engineering, 2019, 48(6): 603012-0603012(19). DOI: 10.3788/IRLA201948.0603012

High-throughput and fast-speed Fourier ptychographic microscopy:A review

  • Fourier ptychographic microscopy(FPM) is a promising label-free computational imaging technique with high resolution, wide field-of-view(FOV) and quantitative phase recovery. Due to its flexible setup, promising high-contrast performance without mechanical scanning and interferometric measurements, FPM has wide applications in the digital pathology, observation and dynamic imaging of label-free cells in vitro. In this review, the principle, research status and the latest advances were introduced in several aspects of FPM such as the system calibration methods, high-throughput imaging and high-speed imaging. The current problems and future trends were also presented.
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