Research on testing technology of column-level ADC in IRFPA digital readout circuits

The digitalization of infrared focal plane arrays (IRFPA) is an important direction for the development of IRFPA, the core of which is the integration of high-performance analog-to-digital converter (ADC) in the readout circuits. In this paper, the digital outputs of readout circuits were discussed to evaluate the performances of IRFPA. Otherwise, the static and dynamic testing methods of column-level ADC in IRFPA were elaborated. Among them, the static performances of ADC were tested based on oversampling principle which improved the testing correctness of the no-missing code resolution. For the ADC static and dynamic testing requirements, combined with Labview software and digital signal acquisition equipments, a testing platform of high-performance ADC was built. Through testing a digital IRFPA, it is verified that the testing method and platform can be used for testing evaluation of column-level ADC in digital readout circuits.