Research progress of laser-beam-induced current microscopy technology

As the research of optoelectronic devices has stepped into the micro/nano scale, the laser-beam-induced current (LBIC) microscopy technology has developed rapidly as a non-destructive, fast, and imageable characterization technology for semiconductor devices. LBIC microscopy enable studying for photoelectric conversion performance of devices under local illumination excitation, and is initially used to detect inhomogeneities or defects in the devices. In recent years, the LBIC microscopy technology has been correlated with other microscopic imaging technologies to perform comprehensive characterization of the multi-physical parameters of the device, which provides an effective strategy for studying the relationship between material-structure-device performance at the micro-nano scale. Based on the advancement of this characterization strategy, researches on the relationship between microscopic crystal structure and performance in photovoltaic devices, new mechanisms of low-dimensional photovoltaics and detection devices, and micro/nanostructure for photovoltaics and photodetection enhancement have all been vigorously developed. Herein, the research progress of LBIC microscopy was reviewed, firstly the basic model and classification of LBIC microscopy were introduced, then the technology and its development in correlation with other types of microscopic imaging were focused on. And further the application of this type of technology in photovoltaic devices and photodetectors was discussed. At last, future development directions of LBIC microscopy and the correlated microscopic imaging technology were prospected.