Experimental study on a CMOS image sensor damaged by a composite laser

Lasers are an effective way to counter photoelectric reconnaissance. To improve the damage efficiency, a new idea of a composite laser damage photodetector is explored. Damage efficiency experiments of a 1064 nm and 532 nm laser with a 10 ns pulse widths and its dual wavelength composite laser, 1064 nm laser with 0.4 ms and 10 ns pulse width and its dual pulse width composite laser on a CMOS image sensor were carried out respectively. The results show that when the dual-wavelength composite laser causes complete damage to the CMOS, the fundamental frequency light energy is 77.8% of the 1064 nm laser alone and 62.5% of the 532 nm laser alone; when the dual-pulse composite laser damages, the pulse width of the 0.4 ms laser is The energy density is reduced to 1.7% of the single action, and the energy density of the 10 ns pulse width laser is reduced to 76.4% of the single action. This discovery provides a new idea and reference for high efficiency optoelectronic countermeasures of multisystem composite lasers.