Li Yunhong, Ma Rong, Zhang Heng, Cao Liu, Huo Ke, Zhao Qiang. Dual waveband colori-metric temperature accurate measurement technology[J]. Infrared and Laser Engineering, 2015, 44(1): 27-35.
Citation: Li Yunhong, Ma Rong, Zhang Heng, Cao Liu, Huo Ke, Zhao Qiang. Dual waveband colori-metric temperature accurate measurement technology[J]. Infrared and Laser Engineering, 2015, 44(1): 27-35.

Dual waveband colori-metric temperature accurate measurement technology

  • Non-contact infared radiation temperature measurement has the advantages such as fast response speed, accurate and convenient. In order to realize accurate measurement of the temperature of low-middle temperature objects (50-400℃), a system of dual waveband colori-metric temperature measurement based on the theory of dual waveband colori-metric temperature measurement was established. Firstly, the devices need to be calibrated accurately to fit curve which needs a variety of interpolation algorithm for correction. Then, the blackbody with given temperature's was measured as a reference.Experimental results indicate that the system of dual waveband colori-metric temperature measurement can precisely obtain the true temperature of low-middle temperature objects without the presence of target launch rate. The standard deviation of the object is within 3℃when the calibrated confidence is 0.95, which proves the validity of this experiment system. The construction of the experimental device for accurate measurement of low temperature object in the real temperature has important research significance.
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