Hartmann-Shack sensor with dual-wedge micro-scanning in wavefront detection technology

The Hartmann-Shack sensor is mainly affected by the dimension and the number of lenticule. Thus the measured wavefront has been inadequate sampled and affected the precision of wavefront. The wavefront reproduction principle of Hartmann sensor and dual-wedges micro-scanning technology were analyzed and disscussed. A new detected method was proposed, which added the structure of dual-wedges micro-scanning. The method can compensate the shortcoming of lacking sample with measured wavefront in the traditional Hartmann sensor. By utilizing Zemax and Lighttools software, spot distribution was simulated by Hartmann sensor of adding dual-wedge micro-scanning structure. Combined with micro-scanning image of reconfiguration algorithm with the wavefront reconstruction algorithm, the principle was verified. The wavefront reconstruction of large aberration by simulation was improved 53.53% in the optical system. Conclusions show that the method can effectively increase the accuracy of wavefront detection by Hartmann sensor with dual-wedge.