Thermal cycle characteristic of InSb focal plane array detector
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Abstract
The cooled InSb infrared focal plane array(IRFPA) detectors should work in the temperature as low as 80 K. As a result, detectors are commonly subjected to thousands of thermal cycle from 80 K to room temperature(300 K) in the entire life cycle. Thermal cycle characteristic of the InSb IRFPA detector was studied. The FPA photoelectric parameter, Dewar heat load and J-T cooling characteristics were analyzed. The results indicated that the maximal fluctuation of the detectivity was 5.5%, the maximal fluctuation of the responsivity was 4.8%, and the number of dead pixels did not increase. The experimental results exhibited that the detectors could undergo at least 2 000 thermal cycles, which provides reference for the research and improvement of detector fabrication.
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