[1] Song Ningfang Qin Jiaomei, Pan Xiong. Evaluating SEU effects in SRAM-based FPGA with bit-by-bit upset fault injection[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012: 38(10): 1285-1289. (in Chinese) 宋凝芳, 秦姣梅, 潘雄. SRAM 型FPGA 单粒子效应逐位翻转故障注入方法[J]. 北京航空航天大学学报, 2012: 38(10): 1285-1289.
[2]
[3]
[4] Fei Yanan. Research on seu fault toleranceamong SRAM-based FPGA using dynamicreconfiguration[D]. Harbin: Harbin Institute of Technology, 2013: 3-9. (in Chinese) 费亚男. 基于动态可重构技术的 FPGA 中 SEU 故障容错方法研究[D]. 哈尔滨: 哈尔滨工业大学, 2013: 3-9.
[5]
[6] Tan Lanfang. The sofeware implemented fault injection study based on single event effects[D]. Changshe: National University of Defense Technology, 2008: 2-12. (in Chinese) 谭兰芳. 面向单粒子效应的软件故障注入技术研究[D]. 长沙: 国防科技大学, 2008: 2-12.
[7] Deng jiaxian. Seu fault-injection system design of SRAM-based FPGA[D]. Harbin: Harbin Institute of Technology, 2013: 5-6. (in Chinese) 邓先坤. SRAM型FPGA SEU故障注入系统设计[D]. 哈尔滨: 哈尔滨工业大学, 2013: 5-6. (in Chinese) Deng Xiankun. Seu fault-injection system design of SRAM-based FPGA[D]. Harbin: Harbin Institute of Technology, 2013: 5-6.
[8]
[9]
[10] Wu shentao. Rearch of SRAM-based FPGA single event upset fault injection system[D]. Xi'an: Xidian University, 2011: 1-10. (in Chinese) 吴圣陶. SRAM型FPGA单粒子翻转效应的故障注入系统研究[D]. 西安: 西安电子科技大学, 2011: 1-10.
[11] Wang Zhongming. Techniques for evaluating single-event effect in SRAM-based FPGAs[D]. Beijing: Tsinghua University, 2011: 39-45. (in Chinese) 王忠明. SRAM型FPGA的单粒子效应评估技术研究[D]. 北京: 清华大学, 2011: 39-45.